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application/pdfIEEE2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO);2019; ; ; Predicting Yield of Photonic Circuits With Wafer-scale Fabrication Variability: Invited PaperWim BogaertsYufei XingYinghao YeUmar KhanJiaxing DongJoris GeesselsMartin FiersDomenico SpinaTom Dhaene
2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)1 May 20193
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