Authors:	W. Bogaerts, P. Bienstman, R. Baets
Title:	Sidewall Roughness in Photonic Crystal Slabs: A Comparison of High-Contrast Membranes and Low-Contrast III-V Epitaxial Structures
Format:	International Conference Proceedings
Publication date:	4/2003
Journal/Conference/Book:	European Conference on Integrated Optics (ECIO)
Volume(Issue):	p.349-352
Location:	Prague, Czech Republic
Citations:	Look up on Google Scholar
Download:	(143KB)

Abstract

We have simulated sidewall roughness in photonic crystal slabs. Structures with a low vertical index contrast (like III-V waveguides) are shown to be more prone to scattering at sidewall roughness than membranes or SOI-like structures.

Related Research Topics

• Low-loss Nanophotonic waveguides (1999-2010)

Related Projects

• IST: PICCO (Photonic Integrated Circuits using photonic Crystal Optics)
• IAP-V: PHOTON (Photons and Photonics : from basic physics to system concepts)