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Authors: K. Quang Le, P. Bienstman
Title: Enhanced Sensitivity of Absorption-Based Surface Plasmon Interference Sensors in Silicon-On-Insulator by Adsorbed Layer
Format: International Conference Proceedings
Publication date: 4/2010
Journal/Conference/Book: 15th European Conference on Integrated Optics
Location: United Kingdom
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We present an numerical investigation of a planar waveguide surface plasmon resonance (SPR) sensor in silicon-on-insulator (SOI) for detecting a change in the imaginary part of the refractive index. By adding a thin adsorbed layer between the metal-analyte boundary it is found that an enhanced sensitivity of the sensor is obtained, suggesting the possibility of realizing a highly integrated and highly sensitive absorption-based SPR sensor in SOI.

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