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Authors: A. Li, Y. Xing, R. Van Laer, R. Baets, W. Bogaerts
Title: Extreme Spectral Transmission Fluctuations in Silicon Nanowires Induced by Backscattering
Format: International Conference Presentation
Publication date: 8/2016
Journal/Conference/Book: IEEE International Conference on Group IV Photonics 2016
Editor/Publisher: IEEE, 
Volume(Issue): p.paper FB4 (2 pages)
Location: Shanghai, China
DOI: 10.1109/GROUP4.2016.7739068
Citations: 4 (Dimensions.ai - last update: 24/3/2024)
1 (OpenCitations - last update: 19/4/2024)
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Abstract

The waveguide is the most fundamental component of integrated photonic circuits. We observe that roughness-induced backscattering in high-contrast silicon waveguides generates over 10 dB spectral transmission variations in centimeter-long silicon waveguides.

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