Authors:	Y. Xing, M. Wang, A. Ruocco, J. Geessels, U. Khan, W. Bogaerts
Title:	Extracting Multiple Parameters from a Compact Circuit for Performance Evaluation
Format:	International Conference Proceedings
Publication date:	4/2019
Journal/Conference/Book:	European Conference on Integrated Optics (ECIO 2019)
Volume(Issue):	p.W.Po1.9
Location:	Ghent, Belgium
Online:	https://www.ecio-conference.org/wp-content/uploads/2019/04/Xing-Yufei-Extracting-Multiple-Parameters-from-a-Compact-Circuit.pdf
Citations:	Look up on Google Scholar
Download:	(1.8MB)

Abstract

We designed a two-stage Mach-Zehnder Interferometer for process monitoring control. Using Restart-CMA-ES global optimization algorithm, we can extract multiple on-chip waveguide and directional coupler parameters simultaneously. The compact design greatly reduces the footprint and number of measurements and improves accuracy for parameter extraction, making it useful for detailed wafer-level variability analysis.

Related Research Topics

• Variability Aware Design
• Compact Circuit Models and Extraction

Related Projects

• FWO: G013815N-ScaleModel (Scalable behavioral models for large-scale silicon photonics)
• VLAIO: MEPIC (Model extraction to enable first-time right photonics integrated circuit design)