Authors:	D. Néel, T. Benyattou, P. Sanchis, J. Marti, W. Bogaerts, P. Dumon, D. Van Thourhout, R. Baets
Title:	Near-Field Characterization of Coupled-Cavity Waveguides on SOI
Format:	International Conference Proceedings
Publication date:	9/2006
Journal/Conference/Book:	European Conference on Optical Communication (ECOC) 2006
Volume(Issue):	p.Th3.1.2
Location:	Cannes, France
DOI:	10.1109/ecoc.2006.4800986
Citations:	Look up on Google Scholar
Download:	(3.1MB)

Abstract

An adiabatic taper is proposed to couple light from a photonic crystal waveguide to a coupled-cavity waveguide. A Scanning Near-Field Optical Microscopy study is realized on these structures. This study permits to identify and to evaluate accurately the losses in the coupled-cavity waveguide.

Related Research Topics

• Silicon (nano)photonic devices fabrication with 193nm and 248nm (DUV) Optical lithography (1999-2012)

Related Projects

• IST: ePIXnet (European Network of Excellence on Photonic Integrated Components and Circuits)