| Authors: | Y. Xing, J. Dong, U. Khan, Y. Ye, D. Spina, T. Dhaene, W. Bogaerts | | Title: | From Parameter Extraction, Variability Models to Yield_Prediction | | Format: | International Conference Presentation | | Publication date: | 11/2018 | | Journal/Conference/Book: | Latin America Optics & Photonics Conference
(invited)
| | Editor/Publisher: | OSA, | | Volume(Issue): | p.paper W3E.1 (3 pages) | | Location: | Lima, Peru | | DOI: | 10.1364/LAOP.2018.W3E.1 | | Citations: | 2 (Dimensions.ai - last update: 15/12/2024)
2 (OpenCitations - last update: 19/4/2024)
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Abstract
We will discuss methods and workflow of variability analysis and yield prediction for integrated photonic circuits, describing the process from wafer-scale parameter extraction over spatial variability modelling to layout-aware yield prediction of photonic circuits. Related Research Topics
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